Program card controlled switch apparatus for testing transistors and the like

Claim 1

IN A MEANS FOR TESTING TRANSISTORS AND THE LIKE, A FRAME STRUCTURE, A BANK OF PLATES FIXEDLY MOUNTED IN SPACED, PARALLEL RELATIONSHIP IN SAID FRAME STRUCTURE, A ROTATABLY MOUNTED SHAFT EXTENDED THROUGH SAID BANK OF PLATES, MEANS TO ROTATE SAID SHAFT, A DISC MOUNTED ON SAID SHAFT IN EACH OF THE SPACES BETWEEN SAID PLATES, MEANS CONNECTING EACH DISC WITH SAID SHAFT FOR NORMAL ROTATION THEREWITH AND ALLOWING RELATIVE ROTATION THEREBETWEEN WHEN THE DISC IS POSITIVELY STOPPED, A DISTRIBUTOR RING MOUNTED ON EACH PLATE CONCENTRIC OF SAID SHAFT, A PLURALITY OF TEST CIRCUITS HAVING END CONTACTS ASSOCIATED WITH EACH PLATE, SAID CONTACTS OF EACH PLURALITY OF TEST CIRCUITS BEING ARRANGED CIRCULARLY ABOUT THE DISTRIBUTOR RING OF THE CORRESPONDING PLATE, A BRUSH ON EACH DISC ADAPTED, WITH THE TURNING OF THE CORRESPONDING DISC, TO ESTABLISH A TEST CIRCUIT CONNECTION BETWEEN THE CORRESPONDING CONTACT RING AND SUCCESSIVELY WITH THE CONTACTS OF THE TEST CIRCUITS ASSOCIATED WITH THE CORRESPONDING PLATE, AND PROGRAMMING MEANS ADAPTED TO ENGAGE AND INDIVIDUALLY STOP THE TURNING OF SAID DISCS TO ESTABLISH DESIRED TEST CIRCUITS.