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US3304908A Expired / Lapsed US ⏱️ 0.0 years remaining

Epitaxial reactor including mask-work support

Assignee: Merck and Co Inc
•
Filing: 1963-08-14
•
Granted: 1967-02-21
•
Expires: 1983-08-14
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Abstract

No abstract record available.

Inventors

  • 👤 Gutsche Heinrich
  • 👤 John P Yorkovich

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 21:18
CPC Classifications
C; C30; C30B; C30B35/00; H; H05; H05B; H05B3/00; H05B3/62; H05B3/64

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 154 words
AN EPITAXIAL REACTOR SYSTEM FOR DEPOSITING UNIFORM EPITAXIAL SILICON LAYERS FROM THE VAPOR PHASE ONTO SILICON SUBSTRATE WAFERS WHICH COMPRISES: (A) A HORIZONTAL REACTOR CHAMBER, (B) AN ELONGATED GRAPHITE SUPPORT GENERALLY HORIZONTALLY POSITIONED IN SAID REACTOR FOR SAID SUBSTRATE WAFERS HAVING A SILICON CARBIDE LAYER THEREON WITH A SILICON OVERLAYER ON SAID SILICON CARBIDE LAYER EXCEPT WHERE THE SILICON SUBSTRATE WAFERS ARE TO BE PLACED WHEN IN OPERATION, SAID SILICON LAYER BEING SUBSTANTIALLY OF THE SAME THICKNESS AS SAID SUBSTRATE WAFERS, (C) MEANS FOR MAINTAINING SAID SUPPORT IN SAID POSITION, (D) ELECTRIC MEANS FOR HEATING SAID SUPPORT THEREBY TO HEAT SAID WAFERS FROM HEAT FROM SAID SUPPORT TO A REACTION TEMPERATURE, (E) A NOZZLE FOR ADMITTING REACTANT GASES INTO SAID CHAMBER BELOW THE LEVEL OF SAID SUPPORT SO AS TO PASS SAID GASES AROUND SAID SUPPORT, AND (F) AN OUTLET TUBE SUBSTANTIALLY CONCENTRIC WITH THE INLET TUBE THROUGH WHICH THE EXIT GASES CAN PASS.
Claim 2
Dependent Claim 154 words
AN EPITAXIAL REACTOR SYSTEM FOR DEPOSITING UNIFORM EPITAXIAL SILICON LAYERS FROM THE VAPOR PHASE ONTO SILICON SUBSTRATE WAFERS WHICH COMPRISES: (A) A HORIZONTAL REACTOR CHAMBER, (B) AN ELONGATED GRAPHITE SUPPORT GENERALLY HORIZONTALLY POSITIONED IN SAID REACTOR FOR SAID SUBSTRATE WAFERS HAVING A SILICON CARBIDE LAYER THEREON WITH A SILICON OVERLAYER ON SAID SILICON CARBIDE LAYER EXCEPT WHERE THE SILICON SUBSTRATE WAFERS ARE TO BE PLACED WHEN IN OPERATION, SAID SILICON LAYER BEING SUBSTANTIALLY OF THE SAME THICKNESS AS SAID SUBSTRATE WAFERS, (C) MEANS FOR MAINTAINING SAID SUPPORT IN SAID POSITION, (D) ELECTRIC MEANS FOR HEATING SAID SUPPORT THEREBY TO HEAT SAID WAFERS FROM HEAT FROM SAID SUPPORT TO A REACTION TEMPERATURE, (E) A NOZZLE FOR ADMITTING REACTANT GASES INTO SAID CHAMBER BELOW THE LEVEL OF SAID SUPPORT SO AS TO PASS SAID GASES AROUND SAID SUPPORT, AND (F) AN OUTLET TUBE SUBSTANTIALLY CONCENTRIC WITH THE INLET TUBE THROUGH WHICH THE EXIT GASES CAN PASS.

References Cited (Backward Citations)

US2828225A Cited
US3151006A Cited
US3131098A Cited
US3184348A Cited
US3098763A Cited
US3152933A Cited
US3220380A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1970-02-20 1970-08-22 1971-02-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1974-02-20 1974-08-22 1975-02-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1978-02-20 1978-08-22 1979-02-21 $7700.00 Window Closed / Lapsed

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