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US3296040A Expired / Lapsed US ⏱️ 0.0 years remaining

Epitaxially growing layers of semiconductor through openings in oxide mask

Assignee: Fairchild Semiconductor Corp
•
Filing: 1962-08-17
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Granted: 1967-01-03
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Expires: 1982-08-17
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Abstract

No abstract record available.

Inventors

  • 👤 Henry F H Wigton

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 05:01
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10D; H10D99/00; H10P14/24; H10P14/27; H10P14/271; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2907; H10P14/2911; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444; H10P95/00; Y; Y10; Y10S; Y10S148/00; Y10S148/007; Y10S148/026; Y10S148/043; Y10S148/049; Y10S148/052; Y10S148/056; Y10S148/085

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 136 words
METHOD OF DEPOSITIING A LAYER O SEMICONDUCTOR MATERIAL BY EPITAXIAL GROWTH BY HALIDE DECOMPOSITION OVER A PORTION OF THE SURFACE OF A SEMICONDUCTOR SUBSTRATE WHILE LEAVING THE REMAINDER OF SAID SURFACE SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR, WHICH COMPRISES: COVERING SAID REMAINDER OF SAID SURFACE WITH A SILICON OXIDE LAYER, AND EXPOSING SAID SURFACE TO A HALIDE DECOMPOSING EPITAXIAL GROWTH ATMOSPHERE AT A TEMPERATURE IN THE RANGE BETWEEN ABOUT 1100* AND 1428*C. THE ACT OF EXPOSING SAID SURFACE TO SAID ATOMOSPHERE BEING CONTROLLED BY A GAS FLOW RATE AND DEPOSTION TIME IN SAID TEMPERATURE RANGE FOR LEAVING A SUBSTANTIAL PORTION OF SAID OXIDE LAYER INTACT WHEN DEPOSTION IS COMPLETED, FOR OBTAINING A LAYER OF SEMICONDUCTOR DEPOSITED ON SAID PORTION OF SIAD SURFACE, AND FOR LEAVING THE SURFACE OF SAID INTACT OXIDE LAYER SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR.
Claim 2
Dependent Claim 136 words
METHOD OF DEPOSITIING A LAYER O SEMICONDUCTOR MATERIAL BY EPITAXIAL GROWTH BY HALIDE DECOMPOSITION OVER A PORTION OF THE SURFACE OF A SEMICONDUCTOR SUBSTRATE WHILE LEAVING THE REMAINDER OF SAID SURFACE SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR, WHICH COMPRISES: COVERING SAID REMAINDER OF SAID SURFACE WITH A SILICON OXIDE LAYER, AND EXPOSING SAID SURFACE TO A HALIDE DECOMPOSING EPITAXIAL GROWTH ATMOSPHERE AT A TEMPERATURE IN THE RANGE BETWEEN ABOUT 1100* AND 1428*C. THE ACT OF EXPOSING SAID SURFACE TO SAID ATOMOSPHERE BEING CONTROLLED BY A GAS FLOW RATE AND DEPOSTION TIME IN SAID TEMPERATURE RANGE FOR LEAVING A SUBSTANTIAL PORTION OF SAID OXIDE LAYER INTACT WHEN DEPOSTION IS COMPLETED, FOR OBTAINING A LAYER OF SEMICONDUCTOR DEPOSITED ON SAID PORTION OF SIAD SURFACE, AND FOR LEAVING THE SURFACE OF SAID INTACT OXIDE LAYER SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR.

References Cited (Backward Citations)

US2858489A Cited
US3064167A Cited
US2945286A Cited
US3000768A Cited
US3089794A Cited
US2995473A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1970-01-02 1970-07-04 1971-01-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1974-01-02 1974-07-04 1975-01-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1978-01-02 1978-07-04 1979-01-03 $7700.00 Window Closed / Lapsed

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