US3296040A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Epitaxially growing layers of semiconductor through openings in oxide mask
Assignee: Fairchild Semiconductor Corp
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Filing: 1962-08-17
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Granted: 1967-01-03
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Expires: 1982-08-17
Abstract
No abstract record available.
Inventors
- 👤 Henry F H Wigton
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 05:01
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10D; H10D99/00; H10P14/24; H10P14/27; H10P14/271; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2907; H10P14/2911; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444; H10P95/00; Y; Y10; Y10S; Y10S148/00; Y10S148/007; Y10S148/026; Y10S148/043; Y10S148/049; Y10S148/052; Y10S148/056; Y10S148/085
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
136 words
METHOD OF DEPOSITIING A LAYER O SEMICONDUCTOR MATERIAL BY EPITAXIAL GROWTH BY HALIDE DECOMPOSITION OVER A PORTION OF THE SURFACE OF A SEMICONDUCTOR SUBSTRATE WHILE LEAVING THE REMAINDER OF SAID SURFACE SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR, WHICH COMPRISES: COVERING SAID REMAINDER OF SAID SURFACE WITH A SILICON OXIDE LAYER, AND EXPOSING SAID SURFACE TO A HALIDE DECOMPOSING EPITAXIAL GROWTH ATMOSPHERE AT A TEMPERATURE IN THE RANGE BETWEEN ABOUT 1100* AND 1428*C. THE ACT OF EXPOSING SAID SURFACE TO SAID ATOMOSPHERE BEING CONTROLLED BY A GAS FLOW RATE AND DEPOSTION TIME IN SAID TEMPERATURE RANGE FOR LEAVING A SUBSTANTIAL PORTION OF SAID OXIDE LAYER INTACT WHEN DEPOSTION IS COMPLETED, FOR OBTAINING A LAYER OF SEMICONDUCTOR DEPOSITED ON SAID PORTION OF SIAD SURFACE, AND FOR LEAVING THE SURFACE OF SAID INTACT OXIDE LAYER SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR.
Claim 2
Dependent Claim
136 words
METHOD OF DEPOSITIING A LAYER O SEMICONDUCTOR MATERIAL BY EPITAXIAL GROWTH BY HALIDE DECOMPOSITION OVER A PORTION OF THE SURFACE OF A SEMICONDUCTOR SUBSTRATE WHILE LEAVING THE REMAINDER OF SAID SURFACE SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR, WHICH COMPRISES: COVERING SAID REMAINDER OF SAID SURFACE WITH A SILICON OXIDE LAYER, AND EXPOSING SAID SURFACE TO A HALIDE DECOMPOSING EPITAXIAL GROWTH ATMOSPHERE AT A TEMPERATURE IN THE RANGE BETWEEN ABOUT 1100* AND 1428*C. THE ACT OF EXPOSING SAID SURFACE TO SAID ATOMOSPHERE BEING CONTROLLED BY A GAS FLOW RATE AND DEPOSTION TIME IN SAID TEMPERATURE RANGE FOR LEAVING A SUBSTANTIAL PORTION OF SAID OXIDE LAYER INTACT WHEN DEPOSTION IS COMPLETED, FOR OBTAINING A LAYER OF SEMICONDUCTOR DEPOSITED ON SAID PORTION OF SIAD SURFACE, AND FOR LEAVING THE SURFACE OF SAID INTACT OXIDE LAYER SUBSTANTIALLY FREE OF DEPOSITED SEMICONDUCTOR.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1970-01-02 | 1970-07-04 | 1971-01-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1974-01-02 | 1974-07-04 | 1975-01-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1978-01-02 | 1978-07-04 | 1979-01-03 | $7700.00 | Window Closed / Lapsed |