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US3290753A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making semiconductor integrated circuit elements

Assignee: AT&T Inc
•
Filing: 1963-08-19
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Granted: 1966-12-13
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Expires: 1983-08-19
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Abstract

No abstract record available.

Inventors

  • 👤 Joseph J Chang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 14:14
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0158; H10P; H10P95/00; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/019; H10W10/10; Y; Y10; Y10S; Y10S148/00; Y10S148/085; Y10S438/00; Y10S438/942; Y10S438/945; Y10S438/977; Y10T; Y10T428/00; Y10T428/12; Y10T428/12389; Y10T428/12396; Y10T428/12486; Y10T428/12493; Y10T428/12528; Y10T428/12535; Y10T428/12583; Y10T428/1259; Y10T428/12674; Y10T428/12736; Y10T428/1275

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 183 words
THE FABRICATION OF A SEMICONDUCTOR INTEGRATED CIRCUIT HAVING A PLURALITY OF ELECTRICALLY ISOLATED WAFERS COMPRISING THE STEPS OF: (A) PREPARING A SLICE OF MONOCRYSTALLINE SILICON, (B) TREATING THE SLICE TO FORM THEREIN A LAYER OF THE SAME CONDUCTIVITY TYPE BUT OF DIFFERING CONDUCTIVITY FROM THAT OF THE ORIGINAL SLICE, (C) PRODUCING ON ONE MAJOR SURFACE OF SAID SLICE AN ETCH RESISTANT MASK CONFORMING TO THE DESIRED ISOLATION PATTERN, (D) ETCHING SAID MASKED SURFACE TO PRODUCE A NETWORK OF SLOTS IN ACCORDANCE WITH THIS SAID PATTERN, (E) REMOVING THE ETCH-RESISTANT MASK, (F) DEPOSITING BY EVAPORATION IN THE NETWORK OF SLOTS AND ON SAID SLOTTED SURFACE A LAYER OF SILICON DIOXIDE, (G) REMOVING FROM THE OPPOSITE MAJOR SURFACE OF SAID SLICE A LAYER OF SEMICONDUCTOR MATERIAL OF A THICKNESS SO AS TO AT LEAST REACH THE BOTTOM OF SAID SLOTS THEREBY PRODUCING AN ARRAY OF ISOLATED SEMICONDUCTOR WAFERS IN SAID SLICE, (H) INTRODUCING SIGNIFICANT IMPURITIES INTO SAID WAFERS TO FORM THEREIN AREAS OF OPPOSITE CONDUCTIVITY TYPE DEFINING PN JUNCTIONS, (I) FORMING ON SAID OPPOSITE MAJOR SURFACE A DEPOSITED METAL FILM PATTERN INTERCONNECTING SAID CIRCUIT ELEMENTS.
Claim 2
Dependent Claim 183 words
THE FABRICATION OF A SEMICONDUCTOR INTEGRATED CIRCUIT HAVING A PLURALITY OF ELECTRICALLY ISOLATED WAFERS COMPRISING THE STEPS OF: (A) PREPARING A SLICE OF MONOCRYSTALLINE SILICON, (B) TREATING THE SLICE TO FORM THEREIN A LAYER OF THE SAME CONDUCTIVITY TYPE BUT OF DIFFERING CONDUCTIVITY FROM THAT OF THE ORIGINAL SLICE, (C) PRODUCING ON ONE MAJOR SURFACE OF SAID SLICE AN ETCH RESISTANT MASK CONFORMING TO THE DESIRED ISOLATION PATTERN, (D) ETCHING SAID MASKED SURFACE TO PRODUCE A NETWORK OF SLOTS IN ACCORDANCE WITH THIS SAID PATTERN, (E) REMOVING THE ETCH-RESISTANT MASK, (F) DEPOSITING BY EVAPORATION IN THE NETWORK OF SLOTS AND ON SAID SLOTTED SURFACE A LAYER OF SILICON DIOXIDE, (G) REMOVING FROM THE OPPOSITE MAJOR SURFACE OF SAID SLICE A LAYER OF SEMICONDUCTOR MATERIAL OF A THICKNESS SO AS TO AT LEAST REACH THE BOTTOM OF SAID SLOTS THEREBY PRODUCING AN ARRAY OF ISOLATED SEMICONDUCTOR WAFERS IN SAID SLICE, (H) INTRODUCING SIGNIFICANT IMPURITIES INTO SAID WAFERS TO FORM THEREIN AREAS OF OPPOSITE CONDUCTIVITY TYPE DEFINING PN JUNCTIONS, (I) FORMING ON SAID OPPOSITE MAJOR SURFACE A DEPOSITED METAL FILM PATTERN INTERCONNECTING SAID CIRCUIT ELEMENTS.

References Cited (Backward Citations)

US2958120A Cited
US3217209A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1969-12-12 1970-06-13 1970-12-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1973-12-12 1974-06-13 1974-12-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1977-12-12 1978-06-13 1978-12-13 $7700.00 Window Closed / Lapsed

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