Method for the analysis of x-rays from an electron probe device

Claim 1

A METHOD OF TESTING MATERIALS TO DETERMINE THEIR CONSTITUENTS BY SPECTROMETRY COMPRISING BOMBARDING THE MATERIAL WITH AN ELECTRON BEAM TO PRODUCE PULSES OF CHARACTERISTIC X-RAYS FROM THE MATERIAL, DETECTING SAID XRAY PULSES TO PRODUCE ELECTRICAL PULSES, ANALYZING THE ELECTRICAL PULSES BY PRODUCING A DISPLAY OF THE PULSE HEIGHT DISTRIBUTION CHARACTERISTIC OF THE MATERIAL, PRODUCING A SECOND DISPLAY SYNTHESIZED BY COMBINING SIGNALS CHRACTERISTIC OF ELECTRICAL PULSES PRODUCED BY SPECTROMETRY FROM KNOWN MATERIALS, ADJUSTING MECHANICALLY THE RELATIVE PROPORTIONS OF THESE LAST MENTIONED SIGNALS UNTIL THE TWO DISPLAYS MATCH EACH OTHER, AND ESTABLISHING FROM THE DEGREE OF MECHANICAL ADJUSTMENT OF THE LAST MENTIONED SIGNALS ON INDICATION OF THE PROPORTIONS OF THE CONTITUENTS OF THE MATERIAL UNDER TEST.

Claim 2

A METHOD OF TESTING MATERIALS TO DETERMINE THEIR CONSTITUENTS BY SPECTROMETRY COMPRISING BOMBARDING THE MATERIAL WITH AN ELECTRON BEAM TO PRODUCE PULSES OF CHARACTERISTIC X-RAYS FROM THE MATERIAL, DETECTING SAID XRAY PULSES TO PRODUCE ELECTRICAL PULSES, ANALYZING THE ELECTRICAL PULSES BY PRODUCING A DISPLAY OF THE PULSE HEIGHT DISTRIBUTION CHARACTERISTIC OF THE MATERIAL, PRODUCING A SECOND DISPLAY SYNTHESIZED BY COMBINING SIGNALS CHRACTERISTIC OF ELECTRICAL PULSES PRODUCED BY SPECTROMETRY FROM KNOWN MATERIALS, ADJUSTING MECHANICALLY THE RELATIVE PROPORTIONS OF THESE LAST MENTIONED SIGNALS UNTIL THE TWO DISPLAYS MATCH EACH OTHER, AND ESTABLISHING FROM THE DEGREE OF MECHANICAL ADJUSTMENT OF THE LAST MENTIONED SIGNALS ON INDICATION OF THE PROPORTIONS OF THE CONTITUENTS OF THE MATERIAL UNDER TEST.