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US3235802A
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US
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Programmable apparatus for automatically and sequentially performing a plurality of tests on a transistor
Assignee: Texas Instruments Inc
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Filing: 1960-09-21
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Granted: 1966-02-15
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Expires: 1980-09-21
Abstract
No abstract record available.
Inventors
- 👤 James R Biard
- 👤 Arthur H Brook
- 👤 Milton C Clerc
- 👤 Shannon E Young
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 11:52
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2608
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
126 words
A SYSTEM FOR AUTOMATICALLY AND SEQUENTIALLY PERFORMING A PLURALITY OF TESTS ON A SEMICONDUCTOR DEVICE COMPRISING MEANS FOR HOLDING A SEMICONDUCTOR DEVICE TO BE TESTED, PROGRAMMABLE MEANS FOR FURNISHING D.C. BIASES FOR SAID SEMICONDUCTOR DEVICE, FIRST PROGRAMMING MEANS FOR CONTROLLING SAID PROGRAMMABLE MEANS TO APPLY THE PARTICULAR D.C. BIAS REQUIRED FOR EACH TEST TO SAID SEMICONDUCTOR DEVICE, SECOND PROGRAMMING MEANS FOR APPLYING AN A.C. SIGNAL TO SAID SEMICONDUCTOR DEVICE, MEANS FOR CONTROLLING SAID FIRST PROGRAMMING MEANS TO CAUSE THE SEQUENTIAL APPLICATION OF THE D.C. BIASES SUITABLE FOR EACH PRESELECTED TEST TO SAID SEMICONDUCTOR DEVICE THROUGH SAID SECOND PROGRAMMING MEANS, AND MEANS FOR MEASURING AT LEAST ONE PRESELECTED A.C. ELECTRICAL QUANTITY CHARACTERIZING SAID SEMICONDUCTOR DEVICE AFTER EACH SET OF BIASES HAS BEEN APPLIED TO SAID SEMICONDUCTOR DEVICE.
Claim 2
Independent Claim
126 words
A SYSTEM FOR AUTOMATICALLY AND SEQUENTIALLY PERFORMING A PLURALITY OF TESTS ON A SEMICONDUCTOR DEVICE COMPRISING MEANS FOR HOLDING A SEMICONDUCTOR DEVICE TO BE TESTED, PROGRAMMABLE MEANS FOR FURNISHING D.C. BIASES FOR SAID SEMICONDUCTOR DEVICE, FIRST PROGRAMMING MEANS FOR CONTROLLING SAID PROGRAMMABLE MEANS TO APPLY THE PARTICULAR D.C. BIAS REQUIRED FOR EACH TEST TO SAID SEMICONDUCTOR DEVICE, SECOND PROGRAMMING MEANS FOR APPLYING AN A.C. SIGNAL TO SAID SEMICONDUCTOR DEVICE, MEANS FOR CONTROLLING SAID FIRST PROGRAMMING MEANS TO CAUSE THE SEQUENTIAL APPLICATION OF THE D.C. BIASES SUITABLE FOR EACH PRESELECTED TEST TO SAID SEMICONDUCTOR DEVICE THROUGH SAID SECOND PROGRAMMING MEANS, AND MEANS FOR MEASURING AT LEAST ONE PRESELECTED A.C. ELECTRICAL QUANTITY CHARACTERIZING SAID SEMICONDUCTOR DEVICE AFTER EACH SET OF BIASES HAS BEEN APPLIED TO SAID SEMICONDUCTOR DEVICE.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-02-14 | 1969-08-16 | 1970-02-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-02-14 | 1973-08-16 | 1974-02-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-02-14 | 1977-08-16 | 1978-02-15 | $7700.00 | Window Closed / Lapsed |