Patent US3233172A successfully refreshed from Google Patents.
US3233172A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of determining the dielectric constant of a material using calibrated standards
Assignee: Corning Glass Works
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Filing: 1960-06-27
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Granted: 1966-02-01
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Expires: 1980-06-27
Abstract
No abstract record available.
Inventors
- 👤 Eino J Luoma
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 16:46
CPC Classifications
G; G01; G01R; G01R27/00; G01R27/28
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
357 words
A METHOD OF DETERMINING THE DIELECTRIC CONSTANT OF A MATERIAL COMPRISING THE STEPS OF TERMINATING ONE END OF A WAVE GUIDE WITH A MICROWAVE SWEEP FREQUENCY GENERATOR, PROPAGATING A RANGE OF SWEPT FREQUENCIES FROM SAID SWEEP GENERATOR ALONG SAID WAVE GUIDE, TERMINATING THE OTHER END OF SAID WAVE GUIDE WITH A FIRST STANDARD HAVING A FIRST KNOWN DIELECTRIC CONSTANT, DETECTING INCIDENT VOLTAGE IN SAID WAVE GUIDE DUE TO SAID FIRST STANDARD, DETECTING REFLECTED VOLTAGE IN SAID WAVE GUIDE DUE TO SAID FIRST STANDARD, COMBINING SAID INCIDENT AND REFLECTED VOLTAGES TO OBTAIN A MEASURE OF POWER REFLECTION COEFFICIENT IN SAID WAVE GUIDE DUE TO SAID FIRST STANDARD, DETERMINING THE AMPLITUDE OF THE PEAK VALUE OF SAID POWER REFLECTION COEFFICIENT OF SAID FIRST STANDARD, SAID PEAK VALUE REPRESENTINGG THE DIELECTRIC CONSTANT OF SAID FIRST STANDARD, REPLACING SAID FIRST STANDARD WITH A SECOND STANDARD HAVING A SECOND KNOWN DIELECTRIC CONSTANT DIFFERING FROM SAID FIRST KNOWN DIELECTRIC CONSTANT, PROPAGATING SAID RANGE OF SWEPT FREQUENCIES FROM SAID SWEEP GENERATOR ALONG SAID WAVE GUIDE, DETECTING INCIDENT VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SECOND STANDARD, DETECTING REFLECTED VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SECOND STANDARD, COMBINING SAID INCIDENT AND REFLECTED VOLTAGES TO OBTAIN A MEASURE OF POWER REFLECTION COEFFICIENT IN SAID WAVE GUIDE DUE TO SAID SECOND STANDARD, DETERMINING THE AMPLITUDE OF THE PEAK VALUE OF SAID POWER REFLECTION COEFFICIENT OF SAID SECOND STANDARD, SAID SECOND DETERMINED PEAK VALUE REPRESENTING THE DIELECTRIC CONSTANT OF SAID SECOND STANDARD, REPLACING SAID SECOND STANDARD WITH A SAMPLE OF UNKNOWN DIELECTRIC CONSTANT, PROPAGATING AID RANGE OF SWEPT FREQUENCIES FROM SAID SWEEP GENERATOR ALONG SAID WAVE GUIDE, DETECTING INCIDENT VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SAMPLE OF UNKNOWN DELECTRIC CONSTANT, DETECTING REFLECTED VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SAMPLE OF UNKNOWN DIELECTRIC CONSTANT, COMBINING SAID LAST MENTIONED INCIDENT AND REFLECTED VOLTAGES TO OBTAIN A MEASURE OF POWER REFLECTION COEFFICIENT IN SAID WAVE GUIDE DUE TO SAID SAMPLE OF UNKNOWN DIELECTRIC CONSTANT, DETERMINING THE AMPLITUDE OF THE PEAK VALUE OF POWER REFLECTION COEFFICIENT OF SAID SAMPLE, SAID LAST DETERMINED PEAK VALUE INDICATING THE DIELECTRIC CONSTANT OF SAID SAMPLE OF UNKNOWN DIELECTRIC CONSTANT.
Claim 2
Independent Claim
357 words
A METHOD OF DETERMINING THE DIELECTRIC CONSTANT OF A MATERIAL COMPRISING THE STEPS OF TERMINATING ONE END OF A WAVE GUIDE WITH A MICROWAVE SWEEP FREQUENCY GENERATOR, PROPAGATING A RANGE OF SWEPT FREQUENCIES FROM SAID SWEEP GENERATOR ALONG SAID WAVE GUIDE, TERMINATING THE OTHER END OF SAID WAVE GUIDE WITH A FIRST STANDARD HAVING A FIRST KNOWN DIELECTRIC CONSTANT, DETECTING INCIDENT VOLTAGE IN SAID WAVE GUIDE DUE TO SAID FIRST STANDARD, DETECTING REFLECTED VOLTAGE IN SAID WAVE GUIDE DUE TO SAID FIRST STANDARD, COMBINING SAID INCIDENT AND REFLECTED VOLTAGES TO OBTAIN A MEASURE OF POWER REFLECTION COEFFICIENT IN SAID WAVE GUIDE DUE TO SAID FIRST STANDARD, DETERMINING THE AMPLITUDE OF THE PEAK VALUE OF SAID POWER REFLECTION COEFFICIENT OF SAID FIRST STANDARD, SAID PEAK VALUE REPRESENTINGG THE DIELECTRIC CONSTANT OF SAID FIRST STANDARD, REPLACING SAID FIRST STANDARD WITH A SECOND STANDARD HAVING A SECOND KNOWN DIELECTRIC CONSTANT DIFFERING FROM SAID FIRST KNOWN DIELECTRIC CONSTANT, PROPAGATING SAID RANGE OF SWEPT FREQUENCIES FROM SAID SWEEP GENERATOR ALONG SAID WAVE GUIDE, DETECTING INCIDENT VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SECOND STANDARD, DETECTING REFLECTED VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SECOND STANDARD, COMBINING SAID INCIDENT AND REFLECTED VOLTAGES TO OBTAIN A MEASURE OF POWER REFLECTION COEFFICIENT IN SAID WAVE GUIDE DUE TO SAID SECOND STANDARD, DETERMINING THE AMPLITUDE OF THE PEAK VALUE OF SAID POWER REFLECTION COEFFICIENT OF SAID SECOND STANDARD, SAID SECOND DETERMINED PEAK VALUE REPRESENTING THE DIELECTRIC CONSTANT OF SAID SECOND STANDARD, REPLACING SAID SECOND STANDARD WITH A SAMPLE OF UNKNOWN DIELECTRIC CONSTANT, PROPAGATING AID RANGE OF SWEPT FREQUENCIES FROM SAID SWEEP GENERATOR ALONG SAID WAVE GUIDE, DETECTING INCIDENT VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SAMPLE OF UNKNOWN DELECTRIC CONSTANT, DETECTING REFLECTED VOLTAGE IN SAID WAVE GUIDE DUE TO SAID SAMPLE OF UNKNOWN DIELECTRIC CONSTANT, COMBINING SAID LAST MENTIONED INCIDENT AND REFLECTED VOLTAGES TO OBTAIN A MEASURE OF POWER REFLECTION COEFFICIENT IN SAID WAVE GUIDE DUE TO SAID SAMPLE OF UNKNOWN DIELECTRIC CONSTANT, DETERMINING THE AMPLITUDE OF THE PEAK VALUE OF POWER REFLECTION COEFFICIENT OF SAID SAMPLE, SAID LAST DETERMINED PEAK VALUE INDICATING THE DIELECTRIC CONSTANT OF SAID SAMPLE OF UNKNOWN DIELECTRIC CONSTANT.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-01-31 | 1969-08-02 | 1970-02-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-01-31 | 1973-08-02 | 1974-02-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-01-31 | 1977-08-02 | 1978-02-01 | $7700.00 | Window Closed / Lapsed |