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US3230625A Expired / Lapsed US ⏱️ 0.0 years remaining

Method and apparatus for scoring semiconductor plates to be broken into smaller bodies

Assignee: Siemens Schuckertwerke AG
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Filing: 1962-11-16
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Granted: 1966-01-25
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Expires: 1982-11-16
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Abstract

No abstract record available.

Inventors

  • 👤 Meyer August

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 20:49
CPC Classifications
B; B28; B28D; B28D5/00; B28D5/0005; B28D5/0011; Y; Y10; Y10T; Y10T225/00; Y10T225/10; Y10T225/12

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 65 words
THE METHOD OF SCORING SILICON AND GERMANIUM SEMICONDUCTOR PLATES TO BE BROKEN INTO SMALLER BODIES ALONG SCORE LINES, WHICH COMPRISES PRESSING A SCORING TOOL BY STORED FORCE AGAINST THE PLATE SURFACE AT SUBSTANTIALLY CONSTANT CONTACT PRESSURE OF ABOUT 50 TO 200 GRAMS, AND PASSING THE TOOL UNDER SAID PRESSURE OVER THE SEMICONDUCTOR SURFACE AT SUBSTANTIALLY CONSTANT SPEED BETWEEN ABOUT 1 AND 5 CM. PER SECOND.
Claim 2
Independent Claim 65 words
THE METHOD OF SCORING SILICON AND GERMANIUM SEMICONDUCTOR PLATES TO BE BROKEN INTO SMALLER BODIES ALONG SCORE LINES, WHICH COMPRISES PRESSING A SCORING TOOL BY STORED FORCE AGAINST THE PLATE SURFACE AT SUBSTANTIALLY CONSTANT CONTACT PRESSURE OF ABOUT 50 TO 200 GRAMS, AND PASSING THE TOOL UNDER SAID PRESSURE OVER THE SEMICONDUCTOR SURFACE AT SUBSTANTIALLY CONSTANT SPEED BETWEEN ABOUT 1 AND 5 CM. PER SECOND.

References Cited (Backward Citations)

US1855078A Cited
US2378033A Cited
US2404222A Cited
US2970730A Cited
US3054709A Cited
US3059337A Cited
US3094785A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1969-01-24 1969-07-26 1970-01-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1973-01-24 1973-07-26 1974-01-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1977-01-24 1977-07-26 1978-01-25 $7700.00 Window Closed / Lapsed

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