X-ray spectrograph having plural detectors

Claim 1

AN X-RAY SPECTROGRAPH FOR DETERMINING THE ELEMENTAL COMPOSITION OF A SPECIMEN OF MATERIAL COMPRISING MEANS TO EXCITE CONSTITUENT ELEMENTS OF A SPECIMEN OF MATERIAL TO PRODUCE CHARACTERISTIC X-RAYS, A DIFFRACTING CRYSTAL POSITIONED TO RECEIVE THE CHARACTERISTIC X-RAYS FROM THE SPECIMEN, SAID CRYSTAL BEING CUT AND ORIENTED TO DIFFRACT RADIATION OF PLURALITY OF WAVE-LENGTHS EACH OF WHICH CORRESPONDS TO ONE OF SAID ELEMENTS IN SAID SPECIMEN FROM A PLURALITY OF DEFLECTING PLANES WITHIN SAID DIFFRACTING CRYSTAL, A PLURALITY OF DETECTORS EACH OF WHICH DETECTS ONE OF SAID WAVE-LENGTHS CORRESPONDING TO ONE OF SAID ELEMENTS IN SAID MATERIAL, AND MEANS FOR POSITIONING SAID DETECTORS TO SEPARATELY AND SIMULTANEOUSLY DETECT EACH OF SAID WAVE-LENGTHS, SAID LATTER MEANS INCLUDING A PLURALITY OF MEMBERS EACH HAVING A SUBSTANTIALLY PLANAR SURFACE UPON WHICH ONE OF SAID DETECTORS IS POSITIONED, SAID MEMBERS BEING PIVOTALLY MOUNTED ABOUT AN AXIS COINCIDENT WITH A CENTRAL RAY OF THE X-RAY BEAM INCIDENT UPON THE DIFFRACTING CRYSTAL, THE PLANAR SURFACE OF ONE OF SAID MEMBERS BEING PARALLEL TO A PRINCIPAL OR EQUATORIAL PLANE AND THE PLANAR SURFACES OF SAID OTHER MEMBERS EACH BEING PARALLEL TO AN ADJUNCT PLANE, EACH OF SAID ADJUNCT PLANES FORMING AN ANGLE A WITH SID EQUATORIAL PLANE SUCH THAT.