US3065112A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for the production of large semiconductor crystals
Assignee: Union Carbide Corp
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Filing: 1958-06-24
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Granted: 1962-11-20
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Expires: 1978-06-24
Abstract
No abstract record available.
Inventors
- 👤 Gilles Jean-Marie Ferdinand
- 👤 Jean Leon Van Cakenberghe
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 06:22
CPC Classifications
C; C30; C30B; C30B23/00; C30B23/02; C30B29/00; C30B29/60; H; H10; H10P; H10P95/00
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
195 words
A PROCESS FOR THE PRODUCTION OF LARGE, THIN CRYSTALS OF SEMICONDUCTOR MATERIAL CONSISTING ESSENTIALLY OF: (A) VACUUM EVAPORATING A LAYER OF SAID SEMICONDUCTOR MATERIAL ONTO A SUBSTANCE, SAID LAYER BEING LESS THAN ABOUT 0.1 MILLIMETER THICK; (B) DEPOSITING A LAYER OF AT LEAST ONE ACTIVATING MATERIAL SELECTED FROM THE GROUP CONSISTING OF SILVER, COPPER, ALUMINUM, INDIUM, GALLIUM, LEAD, BISMUTH, ZINC, BORON, THALLIUM, PHOSPHORUS, ARSENIC, AND ANTIMONY ONTO SAID LAYER OF SEMICONDUCTOR MATERIAL BY CONTACTING SAID LAYER OF SEMICONDUCTOR MATERIAL; THE AMOUNT OF VAPORS OF SAID ACTIVATING MATERIAL; THE AMOUNT OF ACTIVATING MATERIAL DEPOSITED BEING AT LEAST 0.001 ATOM PERCENT IN THE AGGREGATE OF THE AMOUNT OF SEMICONDUCTOR MATERIAL DEPOSITED; (C) INCREASING THE TEMPERATURE OF THE RESULTING LAYERS OF SEMICONDUCTOR MATERIAL AND ACTIVATING MATERIAL TO THE TEMPERATURE AT WHICH NUCLEATION OCCURS WHILE MAINTAINING SAID LAYERS IN A SUBSTANTIALLY INERT ATMOSPHERE; AND (D) THEREAFTER INCREASING THE TEMPERATURE OF SAID LAYERS FROM SAID TEMPERATURE AT WHICH NUCLEATION OCCURS, AT A RATE SUFFICIENT TO PRODUCE A MAXIMUM OF 10 CRYSTALS PER SQUARE CENTIMETER AND A RATE OF GROWTH OF THE CRYSTAL FRONT OF LESS THAN 0.1 MILLIMETER PER SECOND UNTIL CRYSTAL GROWTH IN SAID LAYER OF SEMICONDUCTOR IS COMPLETE.
Claim 2
Dependent Claim
195 words
A PROCESS FOR THE PRODUCTION OF LARGE, THIN CRYSTALS OF SEMICONDUCTOR MATERIAL CONSISTING ESSENTIALLY OF: (A) VACUUM EVAPORATING A LAYER OF SAID SEMICONDUCTOR MATERIAL ONTO A SUBSTANCE, SAID LAYER BEING LESS THAN ABOUT 0.1 MILLIMETER THICK; (B) DEPOSITING A LAYER OF AT LEAST ONE ACTIVATING MATERIAL SELECTED FROM THE GROUP CONSISTING OF SILVER, COPPER, ALUMINUM, INDIUM, GALLIUM, LEAD, BISMUTH, ZINC, BORON, THALLIUM, PHOSPHORUS, ARSENIC, AND ANTIMONY ONTO SAID LAYER OF SEMICONDUCTOR MATERIAL BY CONTACTING SAID LAYER OF SEMICONDUCTOR MATERIAL; THE AMOUNT OF VAPORS OF SAID ACTIVATING MATERIAL; THE AMOUNT OF ACTIVATING MATERIAL DEPOSITED BEING AT LEAST 0.001 ATOM PERCENT IN THE AGGREGATE OF THE AMOUNT OF SEMICONDUCTOR MATERIAL DEPOSITED; (C) INCREASING THE TEMPERATURE OF THE RESULTING LAYERS OF SEMICONDUCTOR MATERIAL AND ACTIVATING MATERIAL TO THE TEMPERATURE AT WHICH NUCLEATION OCCURS WHILE MAINTAINING SAID LAYERS IN A SUBSTANTIALLY INERT ATMOSPHERE; AND (D) THEREAFTER INCREASING THE TEMPERATURE OF SAID LAYERS FROM SAID TEMPERATURE AT WHICH NUCLEATION OCCURS, AT A RATE SUFFICIENT TO PRODUCE A MAXIMUM OF 10 CRYSTALS PER SQUARE CENTIMETER AND A RATE OF GROWTH OF THE CRYSTAL FRONT OF LESS THAN 0.1 MILLIMETER PER SECOND UNTIL CRYSTAL GROWTH IN SAID LAYER OF SEMICONDUCTOR IS COMPLETE.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1965-11-19 | 1966-05-21 | 1966-11-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1969-11-19 | 1970-05-21 | 1970-11-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1973-11-19 | 1974-05-21 | 1974-11-20 | $7700.00 | Window Closed / Lapsed |