Patent US3039604A successfully refreshed from Google Patents.
US3039604A
Expired / Lapsed
US
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Centralized automatic tester for semiconductor units
Assignee: Texas Instruments Inc
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Filing: 1959-09-10
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Granted: 1962-06-19
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Expires: 1979-09-10
Abstract
No abstract record available.
Inventors
- 👤 Richard L Bickel
- 👤 Wendell C Brooke
- 👤 Winthrop J Day
- 👤 Jr Earl D Mcdonald
- 👤 Edwin G Millis
- 👤 James L Nygaard
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 13:51
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2601
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1965-06-18 | 1965-12-18 | 1966-06-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1969-06-18 | 1969-12-18 | 1970-06-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1973-06-18 | 1973-12-18 | 1974-06-19 | $7700.00 | Window Closed / Lapsed |