US2932792A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Transistor testing method
Assignee: International Business Machines Corp
•
Filing: 1957-12-31
•
Granted: 1960-04-12
•
Expires: 1977-12-31
Abstract
No abstract record available.
Inventors
- 👤 William N Carroll
- 👤 Fred E Herdina
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 06:52
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2608
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US2725317A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1963-04-12 | 1963-10-12 | 1964-04-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1967-04-12 | 1967-10-12 | 1968-04-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1971-04-12 | 1971-10-12 | 1972-04-12 | $7700.00 | Window Closed / Lapsed |