Patent US2581394A successfully refreshed from Google Patents.
US2581394A
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US
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Method of and apparatus for measuring the thickness of nonconducting coatings or films
Assignee: Individual
•
Filing: 1945-08-20
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Granted: 1952-01-08
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Expires: 1965-08-20
Abstract
No abstract record available.
Inventors
- 👤 Jacob E Dinger
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 16:17
CPC Classifications
G; G01; G01B; G01B7/00; G01B7/02; G01B7/06; G01B7/10; G01B7/105
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
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US1815717A
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US1943619A
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US1815710A
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US1880802A
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US2083759A
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US2033654A
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US2136675A
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US2219282A
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US2422742A
Cited
US2437639A
Cited
US2393717A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1955-01-07 | 1955-07-09 | 1956-01-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1959-01-07 | 1959-07-09 | 1960-01-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1963-01-07 | 1963-07-09 | 1964-01-08 | $7700.00 | Window Closed / Lapsed |