Testing device for semiconductor device

Abstract

Abstract PURPOSE:To correct the position of a device with the reaction of a contactor unless the device is accurately positioned, and to obtain uniform contacting pressure by suspending and supporting a mount part by a suspender so that it can be elevated from above the contactor. CONSTITUTION:A semiconductor device 2 is mounted on the mount part 10a of the suspender 10 and a presser 8 is lowered opposite it to clamp the semiconductor device with a specific gap to the mount part 10a. Then the presser 8 of the suspender 10 is lowered at the same time and then its external lead 2a contacts a corresponding contactor 3 in the holder 1. In this state, electric characteristics, etc., are tested and then the presser 8 and suspender 10 are elevated at the same time to release the device 2 from a group of contactors 3 at the same time. Then the lead 2a of the device 2 receives the reaction of the contactor 3 while the device is lowered to correct its position to the center of the contactor group unless the device is accurately positioned, thereby obtaining the uniform contacting pressure.

Inventors

• 👤 Kunio Kobayashi
• 👤 Seiji Imanaka

Bibliographic Details