Board tester

Abstract

Abstract PURPOSE:To obtain a board tester which can cope with plural measuring patterns, by constituting the board tester so that a contact stylus of a test probe required for a measurement, among many test probes can be held selectively in an advance position, and a contact stylus of other test probe can be held in a retreat position. CONSTITUTION:A shape memory alloy spring 27 is placed in a guide case 24 being upper than a read end flange part 26 of a contact stylus 25, and a bias spring 28 is placed in a guide case 24 being lower than the rear end flange part 26. To both ends of the spring, and the contact stylus 25, a lead wire 29 for bringing said spring to electric conduction heating as necessary, and a lead wire 30 for connecting said stylus to a measuring device are connected, respectively. Accordingly, when only the spring 27 of a test probe 23 required for a measurement is brought to electric conduction heating selectively, only the contact stylus 25 of its test probe 23 moves to an advance position, and the contact stylus 25 of other test probe 23 is in a retreat position, therefore, when the contact stylus 25 being in the advance position is allowed to contact a printed circuit board 18, in its state, a necessary measurement can be performed.

Inventors

• 👤 Kenzo Kobayashi
• 👤 健造 小林
• 👤 Hideto Tachibana
• 👤 立花　秀人

Bibliographic Details