Refraction intensity measuring apparatus for optical system

Abstract

Abstract PURPOSE:To measure refraction intensity with a high accuracy, by arranging a projector composed of a light source and a chopper plate which is provided between the light source and an optical system to be inspected and formed with a slit split in the surface to scan the optical system being inspected in first and second directions. CONSTITUTION:A chopper disc 11 has portions of shielding light 20 and transmitting light 21 on the outer half circumference thereof, light shielding sections 22 apart equally at an intermediate part 22 and slits prescribed by a specified curve in first and second areas at the inner part 23, which is inserted into the optical path between the light source 1 and an eye 7 to be inspected. As the disc 11 turns counter-clockwise, the identification of the first and second areas is done on the outer side thereof, the detection of frequency information thereof at the intermediate part thereof and then, the eye 7 being inspected is scanned alternatively by a slit luminous flux in the longitudinal direction perpendicular thereto via the first and second areas. The reflected luminous flux from the eye-ground form is made to an image on the light receiving surface of a photoelectric converter 32 and matched with a four-divided photoelectric conversion element 324 located at the center thereof. A phase difference between the outputs of two pairs of photoelectric elements are generated with the scanning. The spherical refraction intensity can be measured accurately by computation of the difference.

Inventors

• 👤 Toru Iwane
• 👤 透 岩根

Bibliographic Details