Semiconductor integrated circuit

Abstract

Abstract PURPOSE:To easily test an integrated circuit by not linking a storing circuit with a shift register, selecting one or plural storing circuits as one unit and permitting the transfer of data between the selected one or plural storing circuits and corresponding one or plural signal lines. CONSTITUTION:To test plural combinational circuits 1a-1c and plural storing circuits 2a-2c, a shift register 4a for the storing circuits 2a and 2b, and a shift register 4b for the storing circuit 2c are provided. Selection circuits 5a and 5b corresponding to each of them are provided, and furthermore, input switching circuits 6a, 6b and 6c that switch input signals are provided at each input side of the storing circuits 2a, 2b and 2c respectively, and output switching circuits 7a, 7b and 7c that switch output signals at each output side of the storing circuits 2a, 2b and 2c respectively. The combinational circuit 1a and the storing circuits 2a and 2b constitute one sequential logical circuit block, and the combinational circuit 1b and the storing circuit 2c constitute another sequential logical circuit block.

Inventors

• 👤 Naoyoshi Nakano
• 👤 中野　直佳
• 👤 Yukihiko Shimazu
• 👤 之彦 島津

Bibliographic Details