Method for stamp indication of container of semiconductor device

Abstract

Abstract PURPOSE:To facilitate the inspection for ensuring the blank region on the surface of the titled container by a method wherein an indication band of a straight line, a curbed line, symbols, or letters is stamped at a fixed interval from the stamp for the trade mark, trade name, etc. CONSTITUTION:The length from the lower end of the stamp 21 to the lower end 11 of the container is A, and that from the lower end of the stamp 21 to the linear stamp 3 for confirmation of region ensuring is B. In this case, only if the presence of this linear stamp on the surface of the container is confirmed with naked eyes, it always serves to ensure the length B required by users, because of formation of the linear stamp 3 and the other stamp 2 for the trade mark and trade name in an integral body.

Inventors

• 👤 Tsutomu Matsuura
• 👤 松浦　勉
• 👤 Hideo Ishikawa
• 👤 石川　英郎

Bibliographic Details