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JPS6069573A Expired / Lapsed JP ⏱️ 0.0 years remaining

Magnetic field measuring device and optical frequency modulator

Assignee: Fujitsu Ltd
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Filing: 1983-09-26
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Granted: —
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Expires: 2003-09-26
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Abstract

Abstract PURPOSE:To obtain relatively small-sized constitution and take a high-precision measurement by measuring the difference frequency between a clockwise and a counterclockwise polarized wave projected from either one of reflecting mirrors respectively. CONSTITUTION:A semiconductor laser 1 is provided with the reflecting surfaces (reflecting mirror) 2 and 3 constituting an external resonator. Then, a lambda/4 plate 4 is provided in front of the reflecting surface 2, and a Faraday rotator 5 and a lambda/4 plate 6 are arranged in front of the reflecting surface 3. Two kinds of light passed through the Faraday rotator 5, i.e. a TE wave and a TM wave projected to the right side of the semiconductor laser 1 are circularly polarized waves differing in rotational direction. Those circularly polarized light waves have a difference in the passing time of the Faraday rotator 5 having constant thickness, so the distance between the reflecting surfaces 2 and 3 is different apparently between the two kinds of light, so that those light waves have different resonance frequencies. A means which controls and varies an applied magnetic field is provided to constitute an optical frequency modulator.

Inventors

  • 👤 Masataka Shirasaki
  • 👤 白崎 正孝
  • 👤 Hiroki Nakajima
  • 👤 啓幾 中島
  • 👤 Yasuo Furukawa
  • 👤 古川 泰男
  • 👤 Yushi Inagaki
  • 👤 雄史 稲垣

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-04 04:59
CPC Classifications
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