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JPS6046067A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor integrated circuit device

Assignee: Hitachi Ltd
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Filing: 1983-08-24
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Granted: —
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Expires: 2003-08-24
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Abstract

Abstract PURPOSE:To enable to highly integrate a semiconductor integrated circuit device by electrically connecting the first electrode to one semiconductor region of an MISFET and employing a semiconductor substrate for the second electrode for forming a memory capacity element, thereby reducing the influence of unnecessary minority carrier. CONSTITUTION:A memory cell is specified by surrounding the periphery of a field insulating film 2 by a pair of patterns, and charge of hole to become information is, for example, stored by the first electrode 7 of a capacity element and the second electrode 4 of a capctity element at both sides of an insulating film 3 for forming a dielectric of a memory capacity element. In order to obtain charge of holes or depletion layer charge to be stored in the capacity element at both sides of the film 3, a threshold voltage higher than the operating voltage to be applied to the electrode 7 is provided near the surface of the substrate 1. The electrode 7 is provided on the film 3, the one end is electrically connected to the one semiconductor region 12 of the MISFET through a connecting hole 5 and a semiconductor region 6, thereby forming a memory capacity element C.

Inventors

  • 👤 Mitsumasa Koyanagi
  • 👤 光正 小柳
  • 👤 Shinji Shimizu
  • 👤 真二 清水

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 04:57
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/30

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS5643753A Cited
JPS5690557A Cited

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