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JPS6046041A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: NEC Corp
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Filing: 1983-08-24
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Granted: —
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Expires: 2003-08-24
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Abstract

Abstract PURPOSE:To improve the reliability by arranging the interval between the centers of bonding pads densely at the center of the side of a semiconductor chip and roughly toward the end, thereby eliminating the contact of adjacent bonding wirings. CONSTITUTION:The interval between the centers of bonding pads 4 of a semiconductor chip 3 is arranged densely at the center of the side of the chip and roughly toward the end. Thus, the adjacent bonding wirings 5 are not contacted at the end of each side of the chip, not passed on the adjacent bonding pads 4, thereby obtaining a semiconductor device having high reliability.

Inventors

  • 👤 Eigo Fuse
  • 👤 布旋 英悟

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-04 23:29
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/90; H10W72/071; H10W72/075; H10W72/07551; H10W72/50; H10W72/541; H10W72/5449; H10W72/931; H10W72/932

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