Semiconductor integrated circuit device

Abstract

Abstract PURPOSE:To facilitate the automatic generation of a test pattern by providing means which make a function logical block (supermacro) whose function is evident irrelevant logically to other circuits (composite logical circuit). CONSTITUTION:When a mode set input pin 152 is held at H, AND circuits G11- are closed, AND circuits G21- are open, and AND circuits G51- are open. A test input is passed through a shift register 9 and supplied from a test input pin 10 and an address input pin 11 to respective supermacros 2, and a test outut is sent out through an output pin 12 and a shift register 13. When a mode set input pin 153 is held at H, AND circuits G41- are opened, and the input from a composite logical circuit 3a is passed through the supermacros 2 and supplied to a composite logical circuit 3b to test the function of the circuit other than the supermacros.

Inventors

• 👤 Takashi Yoshimori
• 👤 吉森　崇

Bibliographic Details