Inspecting method and device by nuclear magnetic resonance

Abstract

Abstract PURPOSE:To obtain fault images of plural slice surfaces related to a specified atomic nucleus distribution, etc. in a body to be inspected, in a short time, by changing forcibly a direction of a magnetization M by three kinds of pulse sequences, and also executing the same method as to another slice surface, within a time when the magnetization M is returned to a thermal balance state. CONSTITUTION:A sequence is executed immediately by selecting other slice surfaces B, C which are different from a slice surface A and are not influenced by a state of magnetization of the slice surface A, by changing a value of offset, without waiting for even a time when a magnetization M of the slice surface A coincides with a Z' axis. That is to say, the value of offset is changed to SB from SA, the slice surface B is selected, a 90 deg. pulse is applied immediately, and after a tau time has elapsed, a (180 deg.-x) pulse is applied, and subsequently, after a tau time has elapsed, a 90 deg. pulse is applied. In the same way, the value of offset is changed to SC from SB, other slice surface C which is different from the slice surface A and B, and is not influenced by a state of magnetization of each slice surface is selected, and a sequence No.3 is executed. In this way, one projection signal of a projecting direction alpha1 is obtained with regard to (n) pieces of slice surfaces A-N, respectively.

Inventors

• 👤 Hideto Iwaoka
• 👤 秀人 岩岡
• 👤 Sunao Sugiyama
• 👤 直 杉山
• 👤 Hiroyuki Matsuura
• 👤 裕之 松浦

Bibliographic Details