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JPS60257546A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device and manufacture thereof

Assignee: Mitsubishi Electric Corp
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Filing: 1984-06-04
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Granted: —
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Expires: 2004-06-04
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Abstract

Abstract PURPOSE:To prevent the crack and peeling of a cover body due to a difference between thermal expansion coefficients by interposing a flexible film between an opening end in a package proper and the cover body sealing the opening end. CONSTITUTION:A semiconductor chip 8 is bonded with one surface of a die pad 6, and the semiconductor chip 8 and leads 7 are connected by bonding wires 9. The die pad 6 is turned over, and a thermosetting resin 10a is attached lightly and placed so as to be in contact with the whole surface of the other surface of the die pad 6 and be positioned in clearances among the leads 7 and the die pad 6. The whole is inserted into a cavity 19, in which an inert gas is introduced, between a die consisting of heated top force 17 and bottom force 18. The resin 10a in a prepreg 16 is softened by the effect of the heat of the die, is pushed out from the clearances among the die pad 6 and the leads 7, and reaches to a cover body 12 consisting of silica glass, which is placed on the bottom force 17 and on which a flexible film 13 is attached, the inert gas is confined among the die pad 6, the cover 12 and the reaching resin, and the resin under a softened state is cured, thus forming a first structure 10.

Inventors

  • 👤 Kunihito Sakai
  • 👤 酒井 国人
  • 👤 Sadamu Matsuda
  • 👤 定 松田
  • 👤 Takashi Takahama
  • 👤 高浜 隆

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-04 17:36
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/06; G11C16/10; G11C16/18; H; H10; H10W; H10W76/00; H10W76/60; H10W72/00; H10W72/50; H10W72/551; H10W72/552; H10W72/5522; H10W74/00; H10W74/10; H10W90/00; H10W90/701; H10W90/751; H10W90/756; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49121; Y10T29/53; Y10T29/5313; Y10T29/53196

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