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JPS6018913A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor device

Assignee: Mitsubishi Electric Corp
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Filing: 1983-07-12
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Granted: —
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Expires: 2003-07-12
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Abstract

Abstract PURPOSE:To make a crystalline layer uniform by a method wherein an amorphous or polycrystalline compound semiconductor layer to be recrystallized is formed on an insulating substrate and a heating layer which has a higher melting point than the semiconductor layer is formed on the semiconductor layer. CONSTITUTION:An amorphous or polycrystalline compound semiconductor layer 2 to be recrystallized is formed on an insulating substrate 1. A heating layer 3 which has a higher melting point than the compound semiconductor is formed on the semiconductor layer 2. The heating layer 3 is composed of a thin diffusion blocking layer 4 deposited by a depressurized CVD method and a heat receiving layer 5 of a polycrystalline silicon film. A laser beam is applied to the heat receiving layer 5 of the heating layer 3 to absorb the energy and the diffusion into the semiconductor 2 is blocked by the diffusion blocking layer 4. The temperature gradient of the semiconductor layer 2 at the time of melting is reduced and the distortion or the like is avoided and the composition at the time of recrystallization is made uniform.

Inventors

  • 👤 Kazuyuki Sugahara
  • 👤 和之 須賀原

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 10:51
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/32; H10P14/3242; H10P14/3244; H10P14/3248; H10P14/38; H10P14/3802; H10P14/3808; H10P14/29; H10P14/2901; H10P14/2921; H10P14/3202; H10P14/3214; H10P14/3221; H10P14/3238; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3818; H10P14/382

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