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JPS60169163A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Hitachi Ltd
•
Filing: 1984-02-13
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Granted: —
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Expires: 2004-02-13
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Abstract

Abstract PURPOSE:To reduce an insulating and isolating region, by performing the insulation and isolation of a P-channel MOS transistor and an N-channel MOS transistor by an insulating and isolating layer, in which a thin gate oxide film and a poly-Si layer are laminated. CONSTITUTION:A thin oxide film 19 is provided on a layer, which is to become a substrate for MOS transistors 101 and 111. The oxide film 19 isolates the transistors 101 and 111 and also isolates an N type substrate 1, a P type region 2 and the drain ends of the transistors 101 and 111. Under a poly-Si layer 20, the drain of the P-channel MOS transistor, the substrate, the substrate of the N- channel MOS transistor and the drain ends are arranged. Since the element isolating region is formed by self-alignment, the part beneath the layer 20 is the film 19. Therefore, the area required for the element isolation can be made small, and the compact element can be implemented.

Inventors

  • 👤 Nobuaki Miyagawa
  • 👤 宣明 宮川
  • 👤 Yasushi Nakayama
  • 👤 中山 泰志
  • 👤 Yoshiaki Yazawa
  • 👤 矢沢 義昭
  • 👤 Tatsuya Kamei
  • 👤 亀井 達弥

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-05 21:17
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D84/858

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS50159980A Cited
JPS5580332A Cited
JPS5736842A Cited
JPS587866A Cited

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