Patent JPS5870542A successfully refreshed from Google Patents.
JPS5870542A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Failure analyzing device for integrated circuit
Assignee: Fujitsu Ltd
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Filing: 1981-10-23
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Granted: —
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Expires: 2001-10-23
Abstract
Abstract Translated from Japanese (57)【要約】本公報は電子出願前の出願データであるた め要約のデータは記録されません。 (57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Inventors
- 👤 Akio Ito
- 👤 昭夫 伊藤
- 👤 Yoshiaki Goto
- 👤 後藤 善朗
- 👤 Yasuo Furukawa
- 👤 古川 泰男
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-10-27 18:20
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; G06F11/26; G06F11/273; G06F11/30; G06F11/32
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
JPS5676545A
Cited
JPS5693339A
Cited
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