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JPS5825221A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor device

Assignee: Toshiba Corp
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Filing: 1982-05-26
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Granted: —
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Expires: 2002-05-26
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Abstract

Abstract PURPOSE:To obtain a substrate suitable for use in a high speed device by a method wherein an insulating film is attached to a single crystal substrate to be provided with some openings, the entire surface is then covered with an amorphous semiconductor film, a laser beam is used to monocrystallize the amorphous semiconductor in an opening, which acts as a seed in a following process of monocrystallizing the entire amorphous semiconductor film, which them is selectively removed. CONSTITUTION:A single crystal Si substrate 1 is coated with an SiO2 film 2, wherein a plurality of openings 3 are provided, then is covered with a thin SiO2 film 4 with an exception of one opening 3 remaining exposed. Next, the entire surface is deposited with a polycrystalline Si film 5, whereinto Si ions 6 are implanted for the creation of defects within for an effective absorption of energy in a later process. A laser beam 7 is then applied to an opening 3 wherein the substrate acts as a seed whereby the film 5 under the beam is developed into a single crystal film 5a which in turn acts as a seed for the transformation of the entire film 5 into a single crystal film 5b under the travelling laser beam 7. Except some prescribed regions, the film thus monocrystallized is dismantled.

Inventors

  • 👤 Hiroyuki Tango
  • 👤 丹呉 浩侑
  • 👤 Yoshihisa Mizutani
  • 👤 水谷 嘉久

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-02 10:17
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/32; H10P14/3202; H10P14/3238; H10P14/29; H10P14/2901; H10P14/2921; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3451; H10P14/3452; H10P14/3458; H10P14/38; H10P14/3802; H10P14/3808; H10P14/382

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