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JPS58147170A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of field effect transistor

Assignee: Fujitsu Ltd
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Filing: 1982-02-26
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Granted: —
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Expires: 2002-02-26
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Abstract

Abstract PURPOSE:To obtain a field effect transistor which does not affect a surface depletion layer by forming by donor impurity ion implantation an N type layer on the surface of a semiconductor on the gate recess part. CONSTITUTION:An N type layer 2 is formed by silicon (Si) or sulfur (S) ion implantation on a semi-insulating substrate 1. A recess structure is formed by chemical etching, and source and drain electrdes 4, 5 are formed of AuGe/Au on the outside. A mask material, i.e., dioxidized silicon film 9 is formed on the bottom of a gate electrode forming part, i.e., a recess structure, and an N<+> type layer 8 is formed by implanting silicon. A dioxidized film 9 is removed, and a gate electrode 3 is formed of aluminum (Al).

Inventors

  • 👤 Kunihiko Kodama
  • 👤 邦彦 児玉

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 05:22
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/80

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