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JPS58147166A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Fujitsu Ltd
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Filing: 1982-02-26
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Granted: —
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Expires: 2002-02-26
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Abstract

Abstract PURPOSE:To obtain a semiconductor device which has fast operating speed and excellent high frequency characteristics equally even under low and high electric fields by utilizing a combination of the properties of arsenided gallium and phosphided indium. CONSTITUTION:A buffer layer 2 made of arsenided gallium (GaAs), a layer 3 made of phosphided indium (InP) containing no impurity and a layer made of arsenided gallium (GaAs) containing an n type impurity are sequentially formed on a substrate 1 made of semi-insulating arsenided gallium (GaAs), thereby forming source and drain electrodes 6, 6' are gate electrode 7. When a negative voltage is applied to a gate electrode 7, a pinch-off occurs at the drain 6' side of the gate electrode 7, electrons are transferred from the layer 4 to the layer 3, thereby performing a transistor operation.

Inventors

  • 👤 Kazukiyo Tsunenobu
  • 👤 和清 常信
  • 👤 Takashi Mimura
  • 👤 高志 三村

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-28 18:56
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/40; H10D30/47; H10D30/471; H10D30/473; H10D30/4732; H10D30/80; H10D30/87

Claims Analysis

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References Cited (Backward Citations)

JPS55132074A Cited
JPS5713773A Cited

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