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JPS58119643A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Seiko Epson Corp
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Filing: 1982-01-08
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Granted: —
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Expires: 2002-01-08
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Abstract

Abstract PURPOSE:To prevent invasion of light from a photo detecting part to active regions forming a semiconductor element by a method wherein injected light being reflected in multiple manner in a transparent insulating material is intercepted by an opaque substance. CONSTITUTION:Injected light to the photo detecting part A formed in a silicon substrate 1 is reflected on the surface of the said silicon substrate 1 through the oxide film 2, while obliquely injected light is reflected complicatedly in the said oxide film 2, and proceeds toward the circumferential circuits B. A groove is formed as to reach the silicon substrate 1 in the oxide film 2 as to surround the photo detecting part A, and the Al electrode material 4 is covered thereon. Accordingly light does not reach the P-N junction parts 3 formed in the circumferential circuits, and junction leakage in the surface or in the inside is not generated completely. Moreover as the electrode material, in addition to Al, Au Mo, polycrystalline silicon, etc., is favorable so far as it is an opaque substance.

Inventors

  • 👤 Toshio Kano
  • 👤 蚊野 利雄

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 07:24
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS5680167A Cited
JPS58107671A Cited

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