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JPS577926A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor device

Assignee: Fujitsu Ltd
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Filing: 1980-06-18
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Granted: —
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Expires: 2000-06-18
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Abstract

Abstract PURPOSE:To form a highly integrated semiconductor device wherein many insulators and semiconductors are layered by forming polycrystal Si or amorphous Si on an insulating film formed on a substrate, and crystallizing said Si by laser annealing. CONSTITUTION:The surface of a polycrystal Si substrate 1 is thermally oxidized and an SiO2 film 2 is formed. Then, amorphous Si is deposited on the SiO2 film 2, and single crystal is obtained by applying laser annealing on a specified part. Thereafter, the amorphous part 1 is converted into an oxide film by thermal oxidization, and the most of the single-crystallized part is formed as a single crystal Si region 3'. In this method, the insulating films and the laser-annealed and single-crystallized semiconductor films are alternately layered, a semiconductor element is formed on said semiconductor film, and the highly integrated semiconductor device can be formed.

Inventors

  • 👤 Kunihiko Wada
  • 👤 Hajime Kamioka
  • 👤 Nobuo Sasaki

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-01 09:42
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/38; H10P14/3802; H10P14/3808; H10P14/3816; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/32; H10P14/3202; H10P14/3238; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3451; H10P14/3452; H10P14/3458; H10P14/382

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