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JPS5776424A Expired / Lapsed JP ⏱️ 0.0 years remaining

Measuring apparatus of temperature distribution of infrared ray

Assignee: NIPPON DENKI SANEI KK
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Filing: 1980-10-29
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Granted: —
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Expires: 2000-10-29
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Abstract

Abstract PURPOSE:To facilitate the measurement of the secular change of temperature distribution in a horizontal direction or formation of an image of developed temperature distribution, by rotating the object to be measured in accordance with a detection means of the image of a temperature distribution line or moving an infrared ray detector rotatatively around said object. CONSTITUTION:On occasion of detecting an image of a temperature distribution line in an X or Y axial direction of the object to be measured by a scanning means of the X or Y axis of a temperature distribution measuring apparatus for infrared rays, self-rotation on the object is carried out in accordance with the action of said scanning means synchronously or a infrared ray detector is rotated around the object. For example, scanning in a horizontal direction is stopped and only the scanning in a vertical direction is carried out in a detection part 23 of an infrared rays type two-dimensional temperature distribution measuring apparatus having the scanning means of the X, Y axes and relative rotating motion of the part 23 and an object to be measured 1', is carried out centering around the axis of the object 1' by using a relative rotation means 26. By said process, measurement of the secular change of the temperature distribution in the horizontal direction or image pickup of the image of developed temperature distribution in the same direction, is facilitated.

Inventors

  • 👤 Masaru Kurokawa

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-01 17:58
CPC Classifications
G; G01; G01J; G01J5/00; G01J5/02; G01J5/04; G01J5/047

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