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JPS5756922A Expired / Lapsed JP ⏱️ 0.0 years remaining

Epitaxially growing method

Assignee: Sanyo Electric Co Ltd
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Filing: 1980-09-19
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Granted: —
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Expires: 2000-09-19
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Abstract

Abstract PURPOSE:To prevent the occurrence of a disordered crack when epitaxially growing with thermal expansion coefficient different from a substrate by forming a notch to meet the final chip size in advance to the surface of the substrate. CONSTITUTION:The (0001) plane of Al2O3 is used as crystalline growing surface 6, and a notch 7 is formed by a laser machining to meet the final chip size in advance. A GaN8 is epitaxially formed thereon. Since the notch is formed in V shape, the GaN single crystal grown from the two surfaces collide with one another at the predetermined time and thereafter becomes polycrystal 20. Since the polycrystal 20 has space between the crystalline grains, the internal stress produced due to the difference of the thermal expansion coefficient is absorbed by the polycrystal 20, and no crack occurs.

Inventors

  • 👤 Kiyoshi Yoneda

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-03 06:43
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/2921; H10P14/2924; H10P14/2925; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3416; H10P14/36

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS50110788A Cited
JPS52103964A Cited

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