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JPS57196166A Expired / Lapsed JP ⏱️ 0.0 years remaining

Voltage measurement device

Assignee: Panasonic Holdings Corp
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Filing: 1981-05-28
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Granted: —
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Expires: 2001-05-28
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Abstract

Abstract PURPOSE:To make it possible to completely eliminate irregular variation in optical output due to change in temperature by connecting conductive films provided on the Z faces of individual electro-optical crystals. CONSTITUTION:The Z face of a single crystal 1 of LiNbO3 is provided with transparent electrodes 7 and 7', and those transparent electrodes 7 and 7' are mutually connected electrically by a gold lead wire 8. On the other hand for the single crystal 1 that is cut in the direction perpendicular to the Z direction an electric field from electrodes 3 and 3' is applied in the direction of the X axis and when a laser light 2 is passed in the direction that is parallel to the Z axis through a deflector 4, the intensity of output of the laser light 2 that is output from the single crystal 1 through a 1/4 wave length plate 6 and a light detection element 5 varies in accordance with the applied voltage that is applied to the single crystal. Accordingly voltage is measured by this intensity of output. In this way in which the electrodes 7 and 7' are electrically connected, electric charges generated by change in temperature of the Z faces of a single crystal of LiNbO3 can be mutually nullified, and thereby generation of electric field that causes error in the measurement due to electric charge can be prevented.

Inventors

  • 👤 Tetsuo Taniuchi

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 02:51
CPC Classifications
G; G01; G01R; G01R15/00; G01R15/14; G01R15/24; G01R15/241; G01R15/242; G02; G02F; G02F1/00; G02F1/01; G02F1/03; G02F1/0305

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