Patent JPH0474018A successfully refreshed from Google Patents.
Patent JPS5654310A successfully refreshed from Google Patents.
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JPS5654310A Expired / Lapsed JP ⏱️ 0.0 years remaining

Device for measurement of pattern area from printing plate for offset print

Assignee: Dai Nippon Printing Co Ltd
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Filing: 1980-01-23
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Granted: —
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Expires: 2000-01-23
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Abstract

Abstract PURPOSE: To make it possible to measure pattern area precisely even if an offset printed is uneven by mounting a printing plate for offset print on a longitudinal inclined stage and by scanning and detecting the pattern of the printing plate by a scanner. CONSTITUTION: Front panel 71 of measuring device 70 is a bevel and at its center part, stage 74 for mounting printing plate 20 is arranged. Between racks 31 and 73, box-shaped scanner 10A enclosing the photodetector and having required circuit constitution incorporated is arranged and the photodetector takes a linear scan on printing plate 20. A detection signal obtained by this scan is inputted to the arithmetic processor to find pattern area. COPYRIGHT: (C)1981,JPO&Japio

Inventors

  • 👤 Tsunehiko Imamoto
  • 👤 Satoru Horiguchi

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 21:25
CPC Classifications
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Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

US3754822A Cited
JPS5444914A Cited

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