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JPS5644274A Expired / Lapsed JP ⏱️ 0.0 years remaining

Defect compensating unit of solid image pickup element

Assignee: Panasonic Holdings Corp
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Filing: 1979-09-20
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Granted: —
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Expires: 1999-09-20
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Abstract

Abstract PURPOSE:To reduce the memory capacity considerably, by storing only position information of defective parts of the solid image pickup element into the memory in the defect compensating unit for the solid image pickup element of the solid image pickup device. CONSTITUTION:Vertical counter 4 is set to a certain value, and horizontal position information of defective parts on the next horizontal scanning line stored in memory 8 is read out during scanning on one horizontal scanning line and is compared with contents of horizontal counter 5 during the next horizontal scanning time; and if they agree with each other, an coincidence pulse is supplied to defect compensating circuit 3 through logical operation circuit 11, and defect compensating circuit 3 performs the hold operation, namely, uses the just preceding picture element signal in stead of the picture element signal from the defective part to perform the compensation operation each time the coincidence pulse is supplied. Since defective position information of solid image pickup element 1 is stored in memory 8, the memory capacity can be reduced considerably in comparison with the case where information indicating presence and absence of defects for all positions of the solid image pickup element is stored in the memory conventionally.

Inventors

  • 👤 Hideo Cho
  • 👤 Toshiharu Inamoto

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 09:43
CPC Classifications
H; H04; H04N; H04N25/00; H04N25/60; H04N25/67; H04N25/68

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