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JPS56114367A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Toshiba Corp
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Filing: 1980-02-14
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Granted: —
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Expires: 2000-02-14
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Abstract

Abstract PURPOSE:To obtain a monolithic semiconductor element small-sized by a method wherein on one semiconductor substrate are mounted having a life time higher than 1 and a diode made low in life time by diffusing killers while being isolated at distance larger than the thickness of the substrate. CONSTITUTION:A P type layer 2 is epitaxially grown on an N type semiconductor substrate 1, being covered with an SiO2 film 3, perforated a prescribed hole and diffused with an N type impurity to form a plurality of N type 4 for the transistors use. Then, the film 3 is perforated the hole for forming the diode which is required for a high speed switching characteristic, while being isolated as long as the distance (l) larger than the thickness (d) of the substrate 1 from the thus obtained transistor 6 of more than 1 in the life time, the N type impurity and the life time killer of gold, copper, iron, nickel, platinum of the like are continuously diffused to cause the diode 7 of the low life time to be grown. Thereafter, as usual, Al electrode 5 are formed on the respective elements.

Inventors

  • 👤 Takao Emoto
  • 👤 Takashi Nishizawa

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-03 12:18
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/60; H10D84/611; H10D84/613; H10D84/617

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