Patent JPS5260686A successfully refreshed from Google Patents.
JPS5260686A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
X-ray photoelectronic analysis
Assignee: Shimadzu Corp
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Filing: 1975-11-14
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Granted: —
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Expires: 1995-11-14
Abstract
Abstract PURPOSE:To perform analysis of specimen by radiating electron beams of a minute focus to a thin-film-form target, allowing the X-ray locally produced thereby to pass thorugh the thin film specimen and detecting the photoelectrons generated by the photoelectric effect of X-ray radiation.
Inventors
- 👤 Hiroyoshi Soejima
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-11-09 14:49
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/227
Claims Analysis
Total Claims: 0
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