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JPS5249083A Expired / Lapsed JP ⏱️ 0.0 years remaining

Device for detecting surface defects of one dimensionally continuous o bjects to be examined

Assignee: Hitachi Ltd
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Filing: 1975-10-17
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Granted: —
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Expires: 1995-10-17
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Abstract

Abstract PURPOSE:Minute sections of an object to be examined are radiated annularly from three circumferential directions by a light source and plural reflecting mirrors, whereby the captioned detecting device which can dispense with one light source and may simplify maintenance and inspection is obtained.

Inventors

  • 👤 Tomohiro Kuni
  • 👤 Nobuyuki Akiyama

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 19:51
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS4520317Y1 Cited

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