JPS5249083A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Device for detecting surface defects of one dimensionally continuous o bjects to be examined
Assignee: Hitachi Ltd
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Filing: 1975-10-17
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Granted: —
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Expires: 1995-10-17
Abstract
Abstract PURPOSE:Minute sections of an object to be examined are radiated annularly from three circumferential directions by a light source and plural reflecting mirrors, whereby the captioned detecting device which can dispense with one light source and may simplify maintenance and inspection is obtained.
Inventors
- 👤 Tomohiro Kuni
- 👤 Nobuyuki Akiyama
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-11-08 19:35
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
JPS4520317Y1
Cited
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