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JPS5248347A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Non-contact method of measuring clearance or level difference by the u se of wave interference phenomena
Assignee: HIIMO LAB KK
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Filing: 1975-10-15
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Granted: —
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Expires: 1995-10-15
Abstract
Abstract PURPOSE: To provide a non-contact method of measuring clearance between a reference plane and the object to be measured or surface ruggendness of the object, by the use of wave interference of light waves, microwaves, sound waves, etc., that have properties of wave interference, in which measurement can be performed without the necessity of direct handling of the object to be measured. COPYRIGHT: (C)1977,JPO&Japio
Inventors
- 👤 Hiroshi Takasaki
- 👤 Kazuo Iwamoto
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-11-09 06:12
CPC Classifications
—
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