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JPS52154351A Expired / Lapsed JP ⏱️ 0.0 years remaining

Formation of electrode contact holes in semiconductor devices

Assignee: Hitachi Ltd
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Filing: 1976-06-18
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Granted: —
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Expires: 1996-06-18
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Abstract

Abstract PURPOSE: Electrode contact holes are formed highly accurately and finely by using dry etching, such as plasma etching, etc., which permits fine working of high accuracy at the time of forming through-holes in a silicon nitride film. COPYRIGHT: (C)1977,JPO&Japio

Inventors

  • 👤 Yuji Hara

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-24 13:53
CPC Classifications
—

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