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Insulating film forming method and semiconductor device

Assignee: Fujitsu Ltd
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Filing: 1995-08-08
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Granted: —
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Expires: 2015-08-08
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Abstract

Abstract Translated from Japanese (57)【要約】 【目的】 本発明は半導体集積回路の多層配線におけ る絶縁膜形成方法に関し、層間絶縁膜として低誘電率で 下地段差を平坦化しつつ、且つ絶縁性、耐湿性、耐熱性 の優れた膜を得る。 【構成】 基板上に形成された有機珪素化合物からな る絶縁膜を弗素プラズマ処理し、続いて、該絶縁膜を酸 素プラズマ処理する。 (57) [Abstract] [Object] The present invention relates to a method for forming an insulating film in a multilayer wiring of a semiconductor integrated circuit. Get an excellent film. [Structure] An insulating film made of an organic silicon compound formed on a substrate is subjected to a fluorine plasma treatment, and then the insulating film is subjected to an oxygen plasma treatment.

Inventors

  • 👤 Tomoko Kobayashi
  • 👤 倫子 小林
  • 👤 Shunichi Fukuyama
  • 👤 俊一 福山
  • 👤 Yoshihiro Nakada
  • 👤 義弘 中田

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-04 22:36
CPC Classifications
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