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JPH0936089A Expired / Lapsed JP ⏱️ 0.0 years remaining

Ashing method and apparatus

Assignee: Toshiba Corp
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Filing: 1995-07-19
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Granted: —
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Expires: 2015-07-19
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Abstract

Abstract Translated from Japanese (57)【要約】 【課題】本発明は、有機薄膜を下地膜に対して選択比を 高くして除去する。 【解決手段】O2 ガスとCHF 3 ガスにNH 3 ガスを混 合したアッシング用ガスをプラズマ発生室9に導入し、 マイクロ波を導入してプラズマを発生させ、このプラズ マにより生じた活性種により被処理体3上の下地膜とし てのa−Si膜5上に形成された有機薄膜(レジスト) 6を除去する。このときa−Si膜5上にアンモニウム 塩が形成され、a−Si膜5に対するエッチングが阻止 される。 (57) Abstract: The present invention removes an organic thin film with a high selection ratio with respect to a base film. SOLUTION: An ashing gas, which is a mixture of O 2 gas, CHF 3 gas and NH 3 gas, is introduced into a plasma generation chamber 9, An organic thin film (resist) formed on the a-Si film 5 as a base film on the object to be processed 3 by the introduction of microwaves to generate plasma and active species generated by the plasma Remove 6. At this time, ammonium salt is formed on the a-Si film 5, and etching of the a-Si film 5 is blocked.

Inventors

  • 👤 Hideo Eto
  • 👤 英雄 江藤
  • 👤 Kayoko Kojima
  • 👤 可容子 小島

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-04 06:58
CPC Classifications
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