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Dry etching method and dry etching apparatus

Assignee: Fujitsu VLSI Ltd
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Filing: 1994-10-12
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Granted: —
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Expires: 2014-10-12
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Abstract

Abstract Translated from Japanese (57)【要約】 【目的】 ドライエッチング方法とその装置に関し、エ ッチングに寄与するイオンと活性種を独立に制御して被 加工物に入射して、被加工物に与えるダメージを少なく して高精度に垂直エッチングする手段を提供する。 【構成】 反応ガスのプラズマ生成部となる上部空間1 1 と、被加工物を保持する試料台5を設ける下部空間1 2 間に複数の細孔4 1 を有する有孔プレート4を配設 し、被加工物を保持する試料台にバイアス電圧を印加す ることなく、有孔プレートの上に配設された上部電極2 と有孔プレートの間に高周波電圧を印加することによっ てプラズマ中のイオンを高速で有孔プレートの細孔を通 過させ、また、有孔プレートの上下の雰囲気に圧力差を 生じさせることによって、プラズマによって生成された 活性種を有孔プレートの細孔を高速で通過させ、被加工 物に垂直に入射させて垂直エッチングを行う。 (57) [Abstract] [Purpose] A dry etching method and apparatus for controlling the ions and active species that contribute to the etching independently and making them incident on the workpiece, thereby reducing damage to the workpiece and increasing the damage. A means for precision vertical etching is provided. [Structure] Upper space 1 serving as a plasma generation part of reaction gas 1 and a lower space 1 provided with a sample table 5 for holding a workpiece The perforated plate 4 having a plurality of pores 4 1 is disposed between the 2, workpiece without applying a bias voltage to the sample stage for holding the upper electrode 2 disposed on the perforated plate The high-frequency voltage is applied between the perforated plate and the perforated plate to cause the ions in the plasma to pass through the pores of the perforated plate at a high speed, and to generate a pressure difference between the upper and lower atmospheres of the perforated plate. The active species generated by the method are passed through the pores of the perforated plate at a high speed and are vertically incident on the workpiece to perform vertical etching.

Inventors

  • 👤 Takashi Kurimoto
  • 👤 孝志 栗本

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-05 21:55
CPC Classifications
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