← Back to Patent Explorer
JPH06232152A Expired / Lapsed JP ⏱️ 0.0 years remaining

Field effect transistor and method of manufacturing the same

Assignee: Mitsubishi Electric Corp
•
Filing: 1993-01-29
•
Granted: —
•
Expires: 2013-01-29
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Translated from Japanese (57)【要約】 【目的】 電界効果トランジスタおいて、ゲート直列抵 抗を増加させることなく高周波特性の向上を目指す。 【構成】 ウエハ1上に、ゲート絶縁膜2,サイドウォ ール5に囲まれたポリシリコンからなる疑似ゲート電極 8を形成し、これを選択的に除去した後、Al等の低抵 抗金属からなる断面T字型のゲート電極30を形成す る。 【効果】 ゲート長が狭く、かつ直列抵抗が低く、高周 波特性の良好な半導体装置を安価に得られる。 (57) [Abstract] [Purpose] In field-effect transistors, the aim is to improve high-frequency characteristics without increasing the gate series resistance. A pseudo gate electrode 8 made of polysilicon surrounded by a gate insulating film 2 and sidewalls 5 is formed on a wafer 1, and after selectively removing it, a cross section made of a low resistance metal such as Al. A T-shaped gate electrode 30 is formed. [Effect] A semiconductor device having a narrow gate length, a low series resistance, and excellent high-frequency characteristics can be obtained at low cost.

Inventors

  • 👤 Akihisa Taniguchi
  • 👤 明久 谷口

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-03 05:12
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/017; H10D64/20; H10D64/23; H10D64/251; H10D64/258; H10D64/259

Claims Analysis

Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag