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JPH0536775A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: NEC Corp
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Filing: 1991-08-02
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Granted: —
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Expires: 2011-08-02
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Abstract

Abstract PURPOSE:To operate a test circuit even when the number of terminals of a semiconductor device does not contain any surplus with reference of the number required for an ordinary operation. CONSTITUTION:A detection circuit 3 and a detection circuit 4 are provided. The detection circuits 3, 4 are set so as to detect the specific surrounding state of respectively different operating surrounding items. A test circuit 2 is operated by detection signals of the detection circuits 3, 4. Thereby, the test circuit 2 is operated only when two items of the detection circuits 3, 4 out of the operating surrounding items are set to the specific surrounding state.

Inventors

  • 👤 Kiminori Kanamori
  • 👤 公則 金森

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 08:04
CPC Classifications
—

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