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JPH04237162A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of cmos semiconductor device

Assignee: Seiko Epson Corp
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Filing: 1991-01-22
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Granted: —
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Expires: 2011-01-22
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Abstract

Abstract PURPOSE:To enable a thin film transistor to be manufactured at a low cost in a manufacturing process using an ion implantation device provided with no mass spectrometer by a method wherein a hollow part is prevented from being induced under a pad through the etching of a base insulating film to have an adversary effect on the after processing of a gate electrode or a wiring. CONSTITUTION:In a thin film transistor manufacturing process, the pads of an N channel transistor section and a P channel transistor section are separately formed. At this point, a thin film serving as a protective film is previously formed on the first-processed pads so as to protect them against etching when the next-processed pads are processed.

Inventors

  • 👤 Satoshi Inoue
  • 👤 聡 井上

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-06 03:45
CPC Classifications
—

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