Automatic magnetic-particle examination apparatus

Abstract

Abstract PURPOSE:To make the automatic judgment of a defect accurate by obtaining the maximum luminance of the no-defect part in an object to be inspected within the luminance distribution of the data of images whose profiles are intensified, and using the luminance as a threshold value for binary coding. CONSTITUTION:The image of an object to be inspected W to which magnetic powder liquid is attached is picked up with an image sensing means C such as a TV camera. The results are digitized into the luminance data for every picture element. Thereafter, the data undergo profile intensifying step with a profile intensifying means M1. Then, the picture element data in a region which is known as a no-defect part within the processed picture elements are sent into a no-defect maximum-luminance detecting means M2. Thus the maximum luminance in the data is detected. The maximum luminance of the luminance distribution of the no-defect part is approximately close to the minimum value of the luminance of the defective part. Therefore, most of the data of the picture elements corresponding to the defective part can be taken out when the vicinity of the maximum luminance with is detected with the means M2 is used as a threshold value. Thus the automatic judgment of the defect can be made accurate.

Inventors

• 👤 Takahiro Fukui
• 👤 福井　貴弘

Bibliographic Details